Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume
نویسندگان
چکیده
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means of Test Point Insertion (TPI). The state-of-the-art TPI methods only focus on solving one or two possible testability problems, and sometimes even fail to result in test set size reduction because they focus on the wrong testability problem. In this paper we propose two TPI pre-process methods that analyze the circuit and select the TPI method that will focus on the testability problems that really exist. Experimental results indicate that with these pre-processes better test set size reductions can be
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